Powerful Testing Capabilities in a Compact Design

LODIMM, SODIMM, UDIMM, RDIMM & LRDIMM

Testing DDR5 memory at enhanced bus speed is something that test engineers would like to see in their memory test system. Manufacturers of memory devices continue to stress the importance of reducing the costs to manufacture modules while maintaining test integrity.

Low cost and high-performance are two phrases you typically do not see associated with memory test systems. This all changes with TurboCATS TCE-3600 module test system. With the single-site and at speeds of up to 3600Mbps, the test system is equipped with industry-standard features essential for memory productivity. TCE-3600 is backward compatible and can also test DDR3 products at speeds of up to 2133Mbps. This feature is available by simply swapping out the DDR5 passive test adapter with the DDR4 or DDR3 passive test adapter and downloading the appropriate software.

Customizable Features

• DDR5 - supports speeds up to 3600Mbps
• DDR4 - supports speeds up to 3200Mbps
• DDR3 - supports speeds up to 2133Mbps
• Custom form factors - supports LODIMM, SODIMM, UDIMM, RDIMM and LRDIMM
• Capable of testing up to 8 testers in parallel at speeds up to 3600Mbps

Features like "At Bus Speed Testing" and support for "High Data Rate Switching" are now standard functions in the new TCE-3600 module test system. Open/ Shorts plus 10 comprehensive AC test patterns give retailers, resellers, integrators, and manufacturers enough testing power to ensure that the products they sell meet the standards of the PC industry.

The TCE-3600 is the answer to cost-effective, high performing DDR5, DDR4 and DDR3 testing for all levels. Repair shops, system integrators, resellers, VARS/ VADS, production floors, etc. now have a viable choice when it comes to testing high speed memory modules.

DDR5 PMIC (Power Management IC) Testing

Features

DDR5 UDIMM PMIC

• Bulk Input Supply Voltage: 4V to 6V (4A)

DDR5 RDIMM/ LRDIMM PMIC

• Bulk Input Supply Voltage: 4V to 10V (5A)
• Management Input Supply Voltage: 2.5V to 4V (1A)

PMIC Testing

• Power Short Test
• Read ID
• Register Test
• Program/ Secure Mode Test
• VR_EN Test (Power Up/ Down Sequence Test)
• PG/ Error Injection Test
• Over Clock Chip Test
• Read/ Program DIMM Vendor Register
• VIN_Bulk Switchover Function (RDIMM only)
• VIN_Bulk Transition Function (RDIMM only)
• Input/ Output Voltage Monitor
• Output/ Current/ Power Monitor
• SPD Hub/ PMIC Temperature Montior

TCE-3600 and Heat Chamber (optional)

Designed for Performance & Affordability

Speeds continue to increase in the ever-changing memory market. Moreover, customers want this speed packed in smaller units. The faster the speed is generated, the more heat will be produced, therefore becoming a major challenge in the tester's performance.

TurboCATS has innovated a new heat chamber that can be integrated with the TCE-3600 DDR5, DDR4 and DDR3 module test systems. This allows for a module and its components to be tested for functionality while being exposed to similar heat conditions to the temperature within a laptop. This optional item is available with the single-site TCE-3600 memory test system.

Heat Chamber Specifications

Power Supply (Main Power)	220V, 50Hz (90 - 110% of rated voltage)
Power Consumption (Main Power)	Power-up: 3A, 220V
	Normal operation: 1.3A, 220V
Display Method	Red 7 Segment LED Display
Storage Temperature	-20°C - 60°C
Ambient Humidity	35% - 85% RH
Temperature Range	25°C - 85°C

Fully Configurable to Fit your Operational Requirements

Network Interface Connects up to 8 Module Testers

Network-Interface Features:

• Easy to use, network-ready
• Improved productivity and portable
• Easy expandability
• Graphical user interface
• Real-time configuration and monitoring
• Remote file editing
• Firmware upgrade via internet

Enchanced Features

Test Capabilities

• DDR5 tests data bandwidth up to 3600Mbps
• DDR4 tests data bandwidth up to 3200Mbps
• DDR3 tests data bandwidth up to 2133Mbps
• Clock frequency from 667MHz to 1800MHz
• Supports high bandwidth data switching
• Enhanced bus cycles at speed testing

Parametric Test & Analysis Test

• Supports Idd's/ SPD test
• SPD program/ test/ read, byte matching, write protection, slot test and serialization
• DDR5/ PMIC (Power Management IC) test
• Open/ Shorts plus 10 comprehensive AC patterns
• Real time Idd monitoring
• Vdd shorted protection
• Failed ICs and DQs, Error logging and location

Flexible Configuration

• Supports DDR3L (Low voltage DDR3)
• Unbuffered and Registered DIMM's
• Optional Form-factor adapters optional
• Network interface connecting up to 8 units

Specifications

DDR5 Clock Frequencies	1600MHz to 1800MHz
DDR5 Data Rate	3200Mbps, 3400Mbps, 3600Mbps
DDR4 Clock Frequencies	800MHz to 1800MHz
DDR4 Data Rate	1600Mbps, 1866Mbps, 2133Mbps, 2400Mbps, 2667Mbps, 2866Mbps, 2933Mbps, 3200Mbps
DDR3 Clock Frequencies	667MHz to 1067MHz
DDR3 Data Rate	1333Mbps, 1600Mbps, 1866Mbps, 2133Mbps
DDR5 Vdd	1.06V to 1.17V
DDR4 Vdd	1.14V to 1.30V
DDR3L Vdd	1.25V to 1.45V
DDR3 Vdd	1.35V to 1.65V
Data Width	72 bits in parallel
Address Depth	DDR5 - 18 Rows, 15 Columns, 5 BAs
	DDR4 - 18 Rows, 15 Columns, 4 BAs
	DDR3 - 16 Rows, 15 Columns, 3 BAs
Programmable Timing Cycles	tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC, etc.
Burst Length	DDR5 - 16 BL; DDR4/ DDR3 - 8 BL
ODT Selection
OCD Adjustment	Auto calibration
All Standard Idd's current test

Software Screenshots