TCIII-UDC-80S
Configurable: 4 to 80 IC's in parallel testing
The TCIII-UDC-80S is designed to provide a high-performance universal (DC) IC tester. The TCIII-UDC-80S provides fast DC parametric testing with cost-effectiveness: Power Short Test, Contact Test and Leakage Test. The tester is suitable for testing a wide range of memory IC types: DRAM, NAND Flash, eMMC, MCP and eMCP. It can be flexible integrated with the interface of manual/ automatic IC handler to increase productivity.
Test Capabilities
Universal (DC) IC Tester
- DC testing on DRAM, NAND Flash, eMMC, MCP and eMCP IC
- Configurable: 4 to 80 IC's at high speed by its DUT board
- Functional Testing (Power Short, Contact and Leakage tests)
- Supports manual/ automated IC handling testing
Power Short
The TCIII-UDC-80S detects the resistance between the corresponding power pin and grounded. If the test result is lower than the set threshold value, it is determined that a Power Short pin has occurred.
| Model | Power Pins | |
|---|---|---|
| DDR4 | VPP - VSS | VDD - VDDQ |
| VPP - VDDQ | VDD - VREFCA | |
| VPP - VREFCA | VDDQ - VREFCA | |
| VDD - VSS | VDDQ - VSS | |
| VDD - VPP | VREFCA- VSS | |
| DDR5 | VPP - VSS | VDD - VPP |
| VPP - VDDQ | VDD - VDDQ | |
| VDD - VSS | VDDQ - VSS | |
| LPDDR4 | VDD1 - VSS | VDD2 - VSS |
| VDD - VDD2 | VDD2 - VDDQ | |
| VDD - VDDQ | VDDQ - VSS | |
| LPDDR5 | VDD1 - VSS | VDD2H - VDDQ |
| VDD1 - VDD2H | VDD2L - VSS | |
| VDD1 - VDD2L | VDD2L - VDDQ | |
| VDD2H - VSS | VDDQ - VSS | |
| VDD2H - VDD2L | ||
Contact Test
The Contact Pattern will detect any open pins on the contacts between the test socket and device during testing. The tester will apply a DC supply voltage to the Contact Test circuit. It scans the defined pins on the DUT. It will have a contact current if the pin is connected.
| Model | Measured Pins |
|---|---|
| DDR4 | Address Pins, Control Pins, DM Pins and DQ Pin |
| DDR5 | |
| LPDDR4 | |
| LPDDR5 | |
| NAND Flash | Data Pins |
| eMMC | Control Pins, Data Pins and Misc Pin (VSF1 to VSF9) |
Leakage Test
This will detect the leakage current (in and out) of the IC pins. The tester applies a DC supply voltage to the Leakage Test circuit. It scans all defined pins on the DUT. The tester will measure the leakage if the pin is shorted to GND/ VDD/ other pins.
| Item | Description |
|---|---|
| VSIM (Leakage) | Range: 0V to 2V |
| Range 1: 1uA to 200uA, Accuracy: ± (1uA+1%) | |
| Range 2: 200uA to 2mA, Accuracy: ± (5uA+1%) | |
| Range 3: 2mA to 32mA, Accuracy: ± (50uA+1%) |
IC Handler Interface
Easy configuration and setup
The TurboCATS series supports both manual and automated handling testing.
Designed to easily integrate with various selected handlers.
Enhanced Features
The TCIII-UDC-80S (DC) Tester
DC testing on DRAM, NAND Flash, eMMC, MCP and eMCP IC - - DRAM: DDR4, DDR5, LPDDR4 and LPDDR5
- - MCP: DRAM + NAND Flash IC
- - eMCP: DRAM + eMMC IC
Configurable for parallel testing 4, 6, 8 or up to 80 IC’s at high speed by its DUT board (depends on IC package)
Functional Testing - - Power Short Test
- - Contact Test
- - Leakage Test
Supports manual and automated handler testing
Variable Power
| Variable Power Supplies | ||||
| DUT | DC Volt | Resolution | Accuracy | |
| DDR4 | VPP | 2.375 to 2.75V | 1mV (approximated) |
±1% (approximated) |
| VDD | 1.1 to 1.4V | |||
| VDDQ | 1.1 to 1.4V | |||
| DDR5 | VPP | 1.7 to 1.95V | ||
| VDD | 1.06 to 1.17V | |||
| VDDQ | 1.06 to 1.17V | |||
| LPDDR4 | VDD1 | 1.7 to 1.95V | ||
| VDD2 | 1.06 to 1.25V | |||
| VDDQ | 1.06 to 1.17V | |||
| LPDDR4X | VDD | 1.7 to 1.95V | ||
| VDD2 | 1.06 to 1.25V | |||
| VDDQ | 0.57 to 0.65V | |||
| LPDDR5 | VDD1 | 1.7 to 1.95V | ||
| VDD2H | 1.01 to 1.12V | |||
| VDD2L | 0.87 to 1.12V | |||
| VDDQ | 0.47 to 0.57V | |||
| 0.27 to 0.37V | ||||
| eMMC | VCC | 2.7 to 3.6V | ||
| VCCQ | 1.6 to 1.95V | |||
| NAND FLASH | VCC | 2.35 to 3.60V | ||
| VCCQ | 1.14 to 1.95V | |||
Note: Information and data are subject to change without notice. For reference only. Contact our sales team for more information.
Operating Requirements
| Item | Description | ||
|---|---|---|---|
| External PC Requirements | Windows 8 operating system or greater, CPU Intel i5 or greater, memory 16 GB or above, LAN port x2, USB port(s), keyboard, mouse, DVD drive, video-either onboard or plug-in card that supports a minimum resolution of 1280 x 1024 | ||
| Operating Environment | Recommend Temperature: 16°C to 32°C (60.8°F to 89.6°F) Recommend Humidity: 20% to 80% |
||
| Recommended Temperature | 16°C to 32°C (60.8°F to 89.6°F) Please keep enviroment ventilated. |
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| Approximate Size | 101 cm x 62 cm x 45 cm | ||
| Dimensions (L x W x H) | Weight: 112.5 kg | ||
Software Screenshots
Main Operating Window
Test Device
Test Plan
Power Short
TURBOCATS, LTD. RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.