DDR5 x8/x16 (DC/AC) Tester

TCIII-6400IC-128S Tester

Efficiency in performance and scalability

Test Capabilities

• DDR5 x8/x16: Support speeds up to 6400Mbps
• Clock frequency from 1600Mhz to 3200Mhz
• 128 DUTs in parallel test for x8 DDR5
• 64 DUTs in parallel test for x16 DDR5
• DC/AC Parametric Tests
• Error logging of Banks/ Rows/ Columns/ DQ’s
• Schmoo Plot and Bit-Mapping
• Graphical display of failed IC’s and failed DQ’s

IC Handler Capabilities

Optimized for productivity

• Environmental temperature test from room temperature to 125˚C
• Capable to handle 128 DUTs of x8bits and 64 DUTs of x16bits devices
• Handling DC test and AC test sequential
• User-friendly interface and ease of docking to testers

GUI Failure Analysis Tool

Graphical Identification of DQ's

Graphically represents the failed DQs' locations.
At the end of the test, the appropriate color will indicate the failed ICs (red) on the components. The indicated color reset automatically at the start of each test. The software uses a graphical picture to illustrate the test failures at the hardware level:

• Level 1: All Failed IC's
  All failed DQs on the IC components are displayed in red on the Main Operating Window to help the users pinpoint the cause of the IC failure.

Shmoo Plot

A two-dimensional diagram that shows the status of the DQ bits of Memory ICs varying over a range of the users' selected parameters (timing and input voltage levels).

Bit Failure Mapping

A tool that helps users find and display the failed DQ bits in the RAM. The corresponding row and column address the failed DQ bits, which will be spotted and dsiplayed for the users.

Pattern Programming

The users can use a C-programming language to create a customized AC command test pattern. The function also serves as a compiler tool and allows the users to test the operation algorithm of the ICs.

Address/ Data Logging

Error logging involves address and data information. Address/ data error logging provides the additional tool for the users to characterize devices and analyze failures.

Features (DDR5)

Powered for productivity

Configuration of Bit-Wide Devices

• 128 DUTs in parallel test for x8 DDR5
• 64 DUTs in parallel test for x16 DDR5

At-Speed Test Capabilities

• Clock frequencies from 1600Mhz to 3200Mhz
• Speed test at (Mbps) 3200, 3600, 4200, 4800, 5200, 5600 and 6400

DUT Power’s Configuration

• User defines VDD/ VDDQ voltage level
• Power’s setting can be defined by each pattern or group patterns

Powerful Failure Analysis Tools

• Graphical display of failed IC’s and failed DQ’s
• Error logging of Banks/ Rows/ Columns/ DQ’s
• Schmoo Plot and Bit-Mapping

DC/ AC Parametric Tests

• DC parametric tests - Power short test, Leakage test and Idd’s test
• AC parametric tests - Industrial test patterns, MB defined test patterns
• C-programming, user defines AC patterns
• User defines MRS’s settings
• User defines AC timing settings

Graphical User Interface

• Easy to create new device library
• Easy to create test-plan for production and engineering analysis testing
• Displays failed IC and failed DQ’s

IC Handler 128 DUTs

Mechanical Layout

• Support x8 DDR5
• Support x16 DDR5

Hardware Requirements

Item	Description
External PC requirements	Windows 8 or above, networking interface
	Minimum Requirements - Runs TCIII-6400IC-128S software to control operation. - Windows 8 operating system or above - i7-core above, 8G RAM above - Display card or on board display - CD-ROM, LAN port x 2, USB port - 1920 x 1080 monitor, keyboard, mouse
AC Power Source	110-240V (AC), 50/60Hz
Recommended Temperature	16°C to 32°C (60.8°F to 89.6°F) Please keep enviroment ventilated.
Humidity Limitation	20% to 80%

Software Screenshots