TCIII-21UPS Die Probing Station

Testing Capabilities

Built to fit your memory testing needs

• DDR3/ DDR4/ DDR5
• LPDDR2/ LPDDR3/ LPDDR4/ LPDDR5
• NAND Flash
• Supports speeds up to 400Mbps

How It Works

• Supports high productivity and enhances efficiency of the handler system
• 2 work zones
• Supports semi-automated Die Handler with TurboCATS series
• Operator loads die on buffer plate and starts the test
• Prevents Probe Card damage during load and unload operations
• Prevents contact fail due to improper alignment

Power Up with the Semi-Automated Die Handler

Stable handling for small packages

Features & Specifications

DDR3/ DDR4

	DDR3	DDR4
Test Frequency	Speed up to 200MHz
Switching Data Rate	Speed up to 400Mbps
I/O Interface	SSTL-15, Class I & Class II SSTL-135, Class I & Class II	POD12-1.2V Pseudo Open Drain I/O
Clock Lines	1 pair
Address Depth	16 Rows, 15 Columns, 3 BAs 16X/ 15Y/ 3Z per site	17 Rows, 15 Columns, 4 BAs 17X/ 15Y/ 4Z per site
Data Width & Depth	8 I/O, Support 8/ 16/ 32 bit IC devices
Control	2 CS's, 2 CLKE, 1 RAS, 1CAS, 1WE
Termination	On-chip, dynamic
Variable Timing Edges	tSU/ tHD, tWD, tDQSS, tAC, etc
Programmable Timing	tRCD, tRP, tCL, tAL, tCWL, tWR, tRL, tWL, tRFC, etc. 1 pair of clock per IC socket

DDR5

Test Frequency	Speed up to 200MHz
Switching Data Rate	Speed up to 400Mbps
I/O Interface	1.1V DRAM I/O
Clock line	1 pair per site
Address Depth	DDR5 17 Rows, 10 Columns 3/2 BG/BA per site
Data Width & Depth	x8/ x16 bit IC device
Termination	On-chip, dynamic
Variable Timing Edges	tSU/tHD, tWD, tAC, Tsref, Tref etc
Programming Timing	tRCD, tRP, tCL, tAL, tCWL, tWR, tRL, tWL, tRFC, etc 1 pair of clock per IC socket

LPDDR2/ LPDDR3/ LPDDR4

	LPDDR2	LPDDR3	LPDDR4/4X
Test Frequency	Speed up to 200MHz
Switching Data Rate	Speed up to 400Mbps
I/O Interface	1.2V HSTL Class	1.2V HSUL	Support LVSTL
Clock Lines	1 pair
Address Depth	14 Rows, 10 Columns, 3 BAs	16 Rows, 15 Columns, 3 BAs	17 Rows, 10 Columns, 3 BAs
Data Width & Depth	8 I/O, Support 8/ 16/ 32 bit IC devices		Support 16/ 32 DQs
Control	2 CS's, 2 CKE, 10 CA
Termination	On-chip, dynamic
Variable Timing Edges	tSU/ tHD, tWD, tDQSS, tAC
Programmable Timing	tRCD, tRP, tWR, tRL, tWL, tRC, tRTP, tRFC, etc. 1 pair of clock per IC socket

NAND Flash

Test Frequency	Supports 100 and 200MHz
Switching Data Rate	Supports 200 and 400Mbps
I/O Interface	ONFI 1.0, ONFI 2.0, ONFI 3.0, Toggle NANDFlash
Control	Async: CE#, R/B#; RE#, ALE, WP#, CLE, WE#
	NV-DDR: CE#, R/B#; W/R#, ALE, WP#, CLE, CLK, DQS
	NV-DDR2: CE#, R/B#, CLE, ALE, RE, WR, WP#, DQS
Variable Timing Edge	tDS, tDH
Programming Timing	Async: tCLS, tCLH, tALS, tALH, tWP, tWH, tDS, tDH, tWC, tADL, tCH, tWW, tCS, tRP, tRC, tREA, tRR, tOH, tWHR, tAR, tWB, tREH, tRHW, tWHR2, tBERS, tR, tPROG
	NV-DDR: tADL, tCAD, tCALS, tDS, tCCS, tDQSCK, tDQSS, tRHW, tWB, tWHR , tWW, tWPRE, tWPST, tBERS, tPROG, tR
	NV-DDR2: tADL, tCALS, tCALH, tCS, tCH, tAR, tRR, tWB, tWHR, tWC, tWP, tWW, tWHR2, tWPRE, tCAS, tCAH, tCDQSS, tCDQSH, tWPST, tWPSTH, tRPRE, tDQSRE, tRPST, tRPSTH, tBERS, tR, tPROG

DC Tests	DC Open, Shorts/ Leakage, Idds Measurement
System & Software Features	DC & AC Parametric Test: User-defined script programming for AC/DC parametric tests Over 35 industry standard test patterns for end users Auto timing calibration VSIM (Contact open pins & Leakage current) optional
	GUI Failure Analysis Tool: Graphical identification of Failed ICs and DQs at Hardware level Error logging up the 8192 locations of Row/ Column/ BA/ Burst/ DQs Bitmapping and Shmoo Plot tool are available for showing the status of the Failed DQ bits in the ICs Address/ Data Scrambling allows user to redefine an address line; determine write data or/ data on input address
	Flexible Configuration : Configurable from 6 to 512 sites for parallel test on production floor. Supports custom load boards for manual test & non-HiFix handler Supports None-Cable HiFix that can be integrated with a selection of handlers' interfaces
	Semi-Automated Die Handler: High productivity and enhanced efficiency Prevents Probe card damage during load and unload operation Prevents contact fail due to improper alignment
Control PC	Windows 8 operating system (64 bit) or better, Networking interface
AC Power Source	110-240VAC, 50/60Hz
External PC Requirements	Executes software to control station operation. Windows 8 operating system (64 bit) or better, i7-core or above, 8G RAM or above, CD ROM, LAN port x2, USB port, monitor with 1920 x 1080 resolution or higher, keyboard, mouse, display card or on-board display
Temperature Limitation	16°C to 32°C (60.8°F to 89.6°F)
Humidity Limitation	20% to 80%

Software Screenshots