Smarter tester for faster testing


Key Features

  • Support DDR5 RDIMM
  • Support DDR5 speed up to 6400Mbps
  • Clock Frequency from 1600MHz to 3200MHz
  • DDR5 PMIC test (RDIMM)
  • AC/DC Parametric tests
  • ECC with 80 bits
  • Graphical interface displays Failed IC's and Failed DQ's
  • Linear Feedback Shift Register (LFSR)

DC Tests

Power Short Test

Idd Measurement

  • Idd4R_Opt_BurstR
  • Idd4W_Opt_BurstW
  • Idd6_Self_Rrefresh

DDR5 PMIC (Power Management IC) Test



  • Bulk Input Supply Voltage: 4.25V to 15V (4A)
  • VIN_Mgmt (Management Input Supply Voltage: 3V to 3.6V (1A))
  • VPP, VDD, VDDQ: Controlled by PMIC on DIMM


  • Read ID
  • Register Test
  • Program/ Secure Mode Test
  • VR_EN Test (Power Up/ Down Sequence Test)
  • PG/ Error Injection Test
  • Over Clock Chip Test
  • Read/ Program DIMM Vendor Register
  • Input/ Output Voltage Monitor
  • Output/ Current/ Power Monitor
  • SPD Hub/ PMIC Temperature Montior
  • Read DIMM Host Region Register (0x00 ~ 0x3F)

Multi-Site Networking

Connectivity to power your testing

Users can simply integrate the new unit into their existing network and utilize the PC that is already in place.

Network-Interface Features

  • Firmware update via internet
  • Graphical user interface software
  • Network-ready and high-performance
  • Real-time configuration and monitoring
  • Ideal for powered productivity
  • Advanced reporting
  • Remote file editing


Increase productivity with enhanced features

Test Capabilities

  • 3200, 3600, 4200, 4800, 5200, 5800, 6400 (Mbps)
  • Clock Frequency from 1600 to 3200 (MHz)
  • 40-bit data channel (32-bit data + 8-bit ECC) x 2 channels per rank,
    total 80 bits per rank
  • Support ECC with 80 bits
  • Support DDR5 RDIMM

Power Short

The TCIII-6400STR DDR5 RIMM tester detects the resistance between the corresponding Power pin and ground. If the test result is lower than the set threshold value, it is determined that a Power short pin has occurred.

  • VIN_Mgmt – VSS
  • DDR5 Powers - VSS (Read PMIC output voltage pins)

AC/DC Parametric & Functional Tests

  • DC Parametric tests: Power Short and defined IDD test
  • AC standard industry test patterns
  • DDR5 PMIC test (RDIMM)
  • SPD Programming, Read/ Write, Software Write Protect
  • C-programming user script to create the customized test patterns

Powerful Failure Analysis Tools

  • Graphical interface displays Failed IC’s and Failed DQ’s
  • Error logging of Row/ Column/ Banks/ DQ’s
  • Support LFSR (Linear Feedback Shift Register)
  • Useful tools include Bit Failure Mapping and specific parameters for Shmoo Plot functions

GUI Failure Analysis Tools

Graphical Identification of DQ's

Graphically represents the failed DQs' locations.
At the end of the test, the appropriate color will indicate the failed ICs (red) on the module. The indicated color reset automatically at the start of each test. The software uses a graphical picture to illustrate the test failures at the hardware level:

  • Level 1: All Failed IC's
    All failed ICs on the components are displayed in red on the Main Operating Window to help the users pinpoint the cause of the module failure.
  • Level 2: All Failed DQ's
    If the users double-click each individual IC, a sub-window will show the actual Failed DQ corresponding to the Failed IC in red.

Shmoo Plot

A two-dimensional diagram that shows the status of the DQ bits of Memory ICs varying over a range of the users' selected parameters (timing and input voltage levels).

Bit Failure Mapping

A tool that helps users find and display the failed DQ bits in the RAM. The corresponding row and column address the failed DQ bits, which will be spotted and dsiplayed for the users.

Pattern Programming

The users can use a C-programming language to create a customized AC command test pattern. The function also serves as a compiler tool and allows the users to test the operation algorithm of the DIMM module.

Address/ Data Logging

Error logging involves address and data information. Address/ data error logging provides the additional tool for the users to characterize devices and analyze failures.

DDR5 RDIMM Specifications

Item Description
Switching Data Rate 3200, 3600, 4200, 4800, 5200, 5800, and 6400 Mbps
Test Frequency 1600 MHz to 3200 MHz
I/O voltage 1.10V DRAM I/O
Clock Lines 1 pair per site
Channel Architecture *1 40-bit data per channel (32-bit data + 8-bit ECC) x 2 channels per rank, total 80 bits per rank
Address Depth 18 Rows, 10 Columns, 3/2 BGs/ BAs per site
Data Width Support x4/ x8 devices
Bank Group & Burst Length 8 Bank Group/ 32 Banks, BL16
ECC Yes/ (80 bits)
Termination On-chip, dynamic
Variable Timing Edges tSU/ tHD, tAC (tDS/ DH), tDQSS, tWD, etc
Programmable Timing tSU/ tHD, tWD, tDQSS, tAC, Tsref, Tref, etc
Variable Power Supplies:
Based on each site supply, depend on IC types)
VIN_Bulk (Bulk Input Supply Voltage) 4.25V to 15V (4A)
VIN_Mgmt(Management Input Supply Voltage) 3V to 3.6V (1A)
Controlled by PMIC on the DIMM

Remark *1: TCIII-6400STR - Support ECC with 80 bits RDIMM

Minimum Hardware Requirements

Item Description
External PC requirements Windows 8 or above, networking interface.
Minimum Requirements
- Runs TCIII-6400STR software to control operation.
- Windows 8 operating system or above
- i7-core above, 8G RAM above
- Display card or on board display
- CD-ROM, LAN port x 2, USB port
- 1920 x 1080 monitor, keyboard, mouse
Remark: The configuration of PC will affect the testing efficient.

AC Power Source 110-240V (AC), 50/60Hz
Recommended Temperature 16°C to 32°C (60.8°F to 89.6°F)
Please keep enviroment ventilated.
Humidity Limitation 20% to 80%

Software Screenshots

Main Operating Window

Test Device (RDIMM)

Test Plan

TURBOCATS, LTD. RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.