NEW! WTC-EN4S

Rapid & Wide Temperature Control Chamber

Designed to provide scalability, flexibility, accuracy and performance

The WTC-EN4S temperature control chamber is equipped with the TurboCATS memory IC tester.
The control chamber integrates rapid and wide temperature directly with the test application. The
wide temperature control chamber is used to test the performance of ICs in various environments.

WTC-EN4S Layout

Taking Control of your Testing

Operation Flow

Step				By	Operation	Remarks
0				Chamber	Initial Stand-by status	Chamber Temp. Control & Tester On-Line is Ready
1				Operator	Loading IC by hands	Manually
2				Operator	Press Start button on the chamber PC UI	Manually
3				Chamber	Temp. Header moves to Front & Down	Alarm/ Popup if Temp. Header has not down surely
4				Chamber	Temp. is rising or falling to Target Temp.	Alarm/ Popup if Temp. Header has not Up/ Down within setting time
5				Chamber PC	Test starts CMD or Tester PC	Send TCP Text Protocol CMD (@STARTTEST+)
6				Tester PC	Test starts receiving CMD to Chamber PC	Reply TCP Text Protocol CMD (@STARTOK+) after got CMD
7				Tester PC	Test ends CMD to Chamber PC	Send TCP Text Protocol CMD (@ENDTEST+)
8				Chamber PC	Test ends receiving CMD to Tester PC	Reply TCP Text Protocol CMD (@ENDOK+) after got CMD
9				Chamber	Temp. Header up for defrost or down cooling	Must keep Defrost Flow when finish Cold Temp. running
10				Chamber	Temp. Header Up & Move to Rear
11				Operator	Unloading IC by hands	Manually

tR/tF Performance

Auto Run Recipe			tR/tF Performance	Remarks
Cold Temp.			25°C -> 40°C (7 mins) -> Testing -> Defrost (10 mins) -> 30°C (2 mins)	Defrost flow (-30 Start, 60 End, 30 Step)
Hot Temp.			25°C -> 125°C (5 mins) -> Testing -> 30°C (5 mins)
Cycle Temp.			25°C -> 40°C (7 mins) -> Testing -> 125°C (7mins) -> Testing -> 30°C (5 mins)	Example of 2-corner testing

Features

Performance Highlights

Temperature Ranges:

• -40 to 125°C
• Setting Resolution 0.1°C
• Tolerance ±3°C

Rapid Temperature Rising/ Falling Time

• (-40 to 125°C) within 10 minutes

Long Continuity Running Time & Short Defrosting Time Ability

Auto Run Recipe

• Cold, Hot and cycle modes

Equipped with TurboCATS IC tester

• DDR/ LPDDR/ NAND ICs
• Supports 4 or 6 DUTs simultaneous testing

Specifications

Item				Description	Specifications	Remarks
Aplication				IC Testing	DDR/ LPDDR/ NAND	0.5mm~1.3mm IC Thickness
C.O.K				Temp. Header Set	Based on DUT board	Fixed Temp. Header Set
				PKG Guide	Based on IC dimensions	200B: 10.0x15.0, 10.0x14.5
Hot/ Cold Chamber				Temp. Range	~40 ~ 125C°	Temperature Control: At the end of the contact pusher
				Setting Temp. Resolution	0.1°C
				Temp. Tolerance	±3°C
				Temp. Rising Time	5 mins (-40 -> 25°C)	Spec. tR/tF time is based on the real performance with the guard band
					5 mins (25 -> 125°C)
					7 mins (-40 -> 125°C)
				Temp. Failing time	5 mins (125 -> 25°C)
					7 mins (25 -> 40°C)
					10 mins (125 -> 40°C)
				Running Time	< 60 hrs (at Cold Temp.)	System Continuity
					No Limit (at Hot Temp.)
				Defrosting Time	10 mins (-30 -> 60 -> 30°C)	Only after Cold Temp.
Utility				Power for Chamber	200V (Single phase) 16A	C19 Type AC Cord
				Power for Chiller	220V (Single phase) 16A
				Compressed Air	0.5MPa 8ø 1 Line	Prevents dew condensation
Interface Protocol				Chamber to Chiller	RS-232C	Chiller Coolant: FC-3283@3M
				Chamber to Tester	TCP/IP	TCP Text Protocol
Chamber Control				Control PC	Industrial PC
				Control Cylinder	PLC
Dimensions				(Width x Depth x Height)	850 x 1260 x 1484 mm	Excluded Tower Lamp (447mm)
Weight				Net Weight	Approx. 325 kg

Note: Information and data are for reference only. Contact our sales team for more details.

Software Screenshot