TCE-2667 DDR4/ DDR3 Tester
Powered for Productivity
Supports DDR4 speeds up to 2667Mbps
LODIMM, SODIMM, UDIMM, RDIMM & LRDIMM
Low Cost and High Performance are two phrases you typically do not see associated with memory test systems. This all changes with TurboCATS' TCE-2667 DDR4 & DDR3 memory test system. With the Single-site and at speeds up to 2667Mbps, the memory test system is equipped with industry-standard features essential for memory productivity.
Features like "At Bus Speed Testing" and support for "High Data Rate Switching" are now standard functions in the new TCE-2667 module test system.
Managing Network Interfaces
Network interface with up to 8 units
Easy to Configure & Manage
- Ideal for powered productivity
- Graphical user interface (GUI)
- Easy configuration & Setup
- Share files effectively with networking
- Optional heat chamber
- Optional handler interface
Features
Test Capabilities
DDR4 tests data bandwidth up to 2667Mbps |
DDR3 tests data bandwidth up to 1866Mbps |
Enhanced bus cycles at speed testing |
Supports high bandwidth data switching |
Analysis Test
Real time Idd monitoring |
Supports DC/ Idds/ AC tests |
Vdd shorted protection |
Open/ Shorts plus 10 comprehensive AC patterns |
SPD program/ test/ read, byte matching, write protection, slot test and serialization |
Flexible Configuration
Supports DDR3L (Low voltage DDR3) |
Unbuffered and Registered DIMM's |
Optional Form-factor adapters |
Networking interface connecting up to 8 test systems |
Specifications
DDR4 clock frequencies: 800 to 1334Mhz |
DDR4 data rate: 1600, 1866, 2133, 2400, 2667Mbps |
DDR3 clock frequencies: 667 to 933MHz |
DDR3 data rate: 1333, 1600, 1866Mbps |
DDR4 Vdd - 1.14V to 1.30V |
DDR3L Vdd - 1.25V to 1.45V |
DDR3 Vdd - 1.35V to 1.65V |
Data width: 72 bits in parallel |
Address depth: DDR4 - 18 Rows, 15 Columns, 4 BAs |
DDR3 - 16 Rows, 15 Columns, 3 BAs |
Programmable timing cycles : tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC, etc. |
Burst Length: 8 |
ODT Selection |
OCD Adjustment: Auto calibration |
All Standard Idds tests |
TCE-2667 and Heat Chamber (optional)
Easy of Use
TurboCATS has innovated a new heat chamber that can be integrated with the TCE-2667 DDR4/3 module test system. This allows for a module and its components to be tested for functionality while being exposed to similar heat conditions to the temperature in a PC or a laptop. This optional item is available with the single site TCE-2667 tester.
Heat Chamber Specifications
Power Supply | 220V, 50Hz (90 - 110% of rated voltage) |
Power Consumption | Power-up: 3A, 220V |
Normal operation: 1.3A, 220V | |
Display Method | Red 7 Segment LED Display |
Storage Temperature | -20°C - 60°C |
Ambient Humidity | 35% - 85% RH |
Temperature Range | 25°C - 85°C |
Software Screenshots
Quick Test (default by factory)
Test Device Configuration
SPD Data
Security Privilege
TURBOCATS, LTD. RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.