At Bus Speed & High Bandwidth Switching Data Rate

LODIMM, SODIMM, UDIMM, RDIMM & LRDIMM

The TCE-3200 memory test system is the answer to cost-effective, high performing DDR4 and DDR3 testing for all levels. Features like "At Bus Speed Testing" and support for "High Data Rate Switching" are now standard functions in the new TCE-3200 module test system. Open/ Shorts plus 10 comprehensive AC test patterns give retailers, resellers, integrators, and manufacturers enough testing power to ensure that the products they sell meet the standards of the PC industry.

Customizable Features

• DDR4 - supports speeds up to 3200Mbps
• DDR3 - supports speeds up to 1866Mbps
• Custom form factors - supports LODIMM, SODIMM, UDIMM, RDIMM and LRDIMM
• Capable of testing up to 8 units in parallel at speeds up to 3200Mbps

TCE-3200 and Heat Chamber (optional)

Interface Features

Speeds continue to increase in the ever-changing memory market. Moreover, customers want this speed packed in smaller units. The faster the speed is generated, the more heat will be produced, therefore becoming a major challenge in the tester's performance.

TurboCATS has innovated a new heat chamber that can be integrated with the TCE-3200 DDR4 and DDR3 module test system. This allows for a module and its components to be tested for functionality while being exposed to similar heat conditions to the temperature in a PC or a laptop. This optional item is available with the single site TCE-3200 module test system.

Heat Chamber Specifications

Power Supply	220V, 50Hz (90 - 110% of rated voltage)
Power Consumption	Power-up: 3A, 220V
	Normal operation: 1.3A, 220V
Display Method	Red 7 Segment LED Display
Storage Temperature	-20°C - 60°C
Ambient Humidity	35% - 85% RH
Temperature Range	25°C - 85°C

We will help you put it all together

Network interface with up to 8 units

Simple Setup, Ease of Management

• Graphical user interface software
• Easy installation and manageability
• Ideal for powered productivity
• Share files effectively with networking
• Free firmware upgrades
• Optional heat chamber
• Optional handler interface

Features

Test Capabilities

DDR4 tests data bandwidth up to 3200Mbps

DDR3 tests data bandwidth up to 1866Mbps

Clock frequency from 667MHz to 1600MHz

Supports high bandwidth data switching

Enhanced bus cycles at speed testing

Parametric Test & Analysis Test

Supports DC/ Idd's/ SPD test

SPD program/ test/ read, byte matching, write protection, slot test and serialization

Open/Shorts plus 10 comprehensive AC patterns

Real time Idd monitoring

Vdd shorted protection

Failed ICs and DQs, Error logging and location

Flexible Configuration

Supports DDR3L (Low voltage DDR3)

Unbuffered and Registered DIMM's

Optional Form-factor test adapters

Network interface with up to 8 units

Specifications

DDR4 clock frequencies: 800 to 1600MHz

DDR4 data rate: 1600, 1866, 2133, 2400, 2667, 2866, 2933, 3200Mbps

DDR3 clock frequencies: 667 to 933MHz

DDR3 data rate: 1333, 1600, 1866Mbps

DDR4 Vdd - 1.14V to 1.30V

DDR3L Vdd - 1.25V to 1.45V

DDR3 Vdd - 1.35V to 1.65V

Data width: 72 bits in parallel

Address depth: DDR4 - 18 Rows, 15 Columns, 4 BAs

DDR3 - 16 Rows, 15 Columns, 3 BAs

Programmable timing cycles : tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC, etc.

Burst Length: 8

ODT Selection

OCD Adjustment: Auto calibration

All Standard Idd's current test

Software Screenshots