NEW! TCIII-1800N-XXD NAND Flash/ eMMC System

NAND Flash Support Features

• Test Frequency
  - 3D NF: Supports up to 600Mhz
  - 2D NF: Supports up to 200Mhz
• Switching Data Rate
  - 3D NF: Supports up to 1200Mbps
  - 2D NF: Supports up to 400Mbps
• I/O Interface: ONFI 1.0, ONFI 2.0, ONFI 3.0, ONFI 4.0
• VCCQ Voltage: 1.8V (max)
• 3D NAND Flash speeds up to 1200Mbps
• Operating clock frequency up to 600MHz
• Configurable for testing from 8 to 256 devices in parallel and at the same speed
• IC components, custom test sockets and load boards
• Supports DC short and Leakage testing
• Provides DC/ ICC/ AC parametric tests
• Read ID Function
• Built-in ICC Patterns
  - Sequential read operating, Erase operating, Stand-by current (TTL), etc.
• Over 20 Industry AC Patterns
  - AC Timing mode for Async, Sync and Toggle, respectively
  - Supports Block/ Page/ Column modes
  - Read and Mark bad Blocks
  - Supports cache read, sequential read and copy back

Configurable for Testing From 8 to 256 Devices in Parallel

Ultimate Peformance & Highly Expandable IC Test System

Optional Testing Functions

• Supports integration of the Signal Tap software
• User-defined Script Code test patterns programming

Home Screen
Script Code Program
Signal Tap Tool

eMMC Supported Features

• Supports High Speed, HS200 and HS400 modes
• VCCQ Voltage: 1.8V (max)
• Configurable for testing from 8 to 256 ICs in parallel and at the same speed
• Supports IC components, custom test sockets and load boards
• Supports DC short and Leakage testing
• Provides DC/ ICC/ AC parametric tests
• Read ID Function
  - CID (Device Identification) Register Read
  - CSD (Device-Specific Data) Register Read
  - Extended CSD Register Read
• User Area Erase
• User Area Data Write - Single-block Write and Multiple-block Write
• User Area Data Read - Single-block Read and Multiple-block Read

Handler Interface

The TurboCATS series supports both manual and automated handler testing. Designed to be easily integrated with various handlers.

Features

System & Software

• Supports DC short and Leakage testing
• Provides DC/ ICC/ AC parametric tests
• VCCQ Voltage: 1.8V (max)
• Read ID Function
  NAND Flash IC
  Built-in ICC pattern includes:
  - Sequential read operating, erase operation, stand-by current (TTL), etc
  eMMC IC
  - CID (Device Identification Register) Read
  - CSD (Device-Specific Data) Read
  - Extended CSD Register Read
• Provides industry AC patterns
  NAND Flash IC
  - AC Timing mode for Async, Sync and Toggle, respectively
  - Supports Block/ Page/ Column modes
  - Read and Mark bad Blocks
  - Supports cache read, sequential read, copy back, etc
  eMMC IC
  - Supports High Speed, HS200 and HS400 modes
  - User Area Erase
  - User Area Data Write/ Read
  - Single-block and Multiple Write/ Read
• Configurable for testing from 8 to 256 ICs in parallel and at the same speed

Optional Integration

• Supports IC components, custom test socket and load boards
• Supports manual or automated handler testing
• Designed to be easily integrated with various handlers

Specifications

NAND Flash Support Specifications

Test Frequency	3D NF - SupportS up to 600MHz 2D NF - SupportS up to 200MHz
Switching Data Rate	3D NF - Supports up to 1200Mbps 2D NF - Supports up to 400Mbps
I/O Interface	ONFI 1.0, ONFI 2.0, ONFI 3.0, ONFI 4.0
Control	Async: CE#, R/B#; RE#, ALE, WP#, CLE, WE# NV-DDR: CE#, R/B#; W/R#, ALE, WP#, CLE, CLK, DQS NV-DDR2: CE#, R/B#, CLE, ALE, RE, WR, WP#, DQS
Variable Timing Edges	tDS, tDH
Programmable Timing	Async: tCLS, tCLH, tALS, tALH, tWP, tWH, tDS, tDH, tWC, tADL, tCH, tWW, tCS, tRP, tRC, tREA, tRR, tOH, tWHR, tAR, tWB, tREH, tRHW, tWHR2, tBERS, tR, tPROG NV-DDR: tADL, tCAD, tCALS, tDS, tCCS, tDQSCK, tDQSS, tRHW, tWB, tWHR , tWW, tWPRE, tWPST, tBERS, tPROG, tR NV-DDR2: tADL, tCALS, tCALH, tCS, tCH, tAR, tRR, tWB, tWHR, tWC, tWP, tWW, tWHR2, tWPRE, tCAS, tCAH, tCDQSS, tCDQSH, tWPST, tWPSTH, tRPRE, tDQSRE, tRPST, tRPSTH, tBERS, tR, tPROG

DC System Specifications

Variable Power Supplies (Based on each site supply)	VCC:	1.0 to 3.3V
	VCCQ:	3D - 1.2/1.8V 2D - 1.8V
	VREF:	0.5 to 1.0V
	(Resolution 1mV, ±1%)
DUT Idds Measurement	For 8 DUT NF Idd Measurement
	Range 0: Standby Idd	1uA to 5mA	Accuracy: 1uA+1%
	Range 1: Opt Idd	5mA to 100mA	Accuracy: 1mA+1%
	Range 2: Opt Idd	100mA to 1000mA	Accuracy: 10mA+1%
Leakage/ Contact: VSIM	Force Voltage Range: 0V to 2V
	Measurement Current
	Range 1:	1uA to 200uA,	Accuracy: ±(1uA+1%)
	Range 2:	200uA to 2mA,	Accuracy: ±(5uA+1%)
	Range 3:	2mA to 32mA,	Accuracy: ±(50uA+1%)
Power Short Pins (optional)	Power Short Resistance (For Room Temperature)		Accuracy
VCC -> VSS VCCQ -> VSS VREF -> VSS	20 ohm to 1K ohm		±20 ohm

eMMC Supported Features

Speed Mode	Supports High Speed, HS200 and HS400
Test Function	Provides DC/ ICC/ AC parametric tests Supports DC short and Leakage testing
Read ID Function	CID (Device Identification Register) Read CSD (Device-Specific Data) Read Extended CSD Register Read
User Function	User Area Erase User Area Data Write - Single-block Write and Multiple-block Write User Area Data Read - Single-block Read and Multiple-block Read

Minimum Hardware Requirements

PC System	Windows 7 or above, Networking interface
AC Power Source	110-240 VAC, 50/60Hz
External PC Requirements	Executes software to control station operation Windows 7 operating system or above, i7-core or above, 8G RAM or above, CD ROM, LAN Port x2, USB Port, monitor with 1920 x 1080 resolution or higher, keyboard, mouse, display card or on-board display
Recommend Temperature Condition	16°C to 32°C (60.8°F to 89.6°F)
Humidity Limitation	20°C to 80%

Software Screenshots